Drilldown: references

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: 24765:2010 Systems and Software Engineering—Vocabulary

or Computer Algorithms

or ISO/IEC 15504-1:2004 Information Technology—Process Assessment—Part 1: Concepts and Vocabulary

or Professional Issues in Software Engineering

or Software Metrics and Software Metrology

or Software Testing Verification and Reliability

or The CERT C Secure Coding Standard

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1 - 2 (16) · 2 - 5 (42) · 5 - 7 (24) · 7 - 11 (32) · 11 - 30 (36)

None (140) · Acquiring COTS Software Selection Requirements (1) · Adaptive Random Testing: The ART of Test Case Diversity (1) · An Analysis and Survey of the Development of Mutation Testing (1) · An Analysis of the Requirements Traceability Problem (1) · Inquiry-Based Requirements Analysis (1) · Notes on Structured Programming (1) · Offering Software Maintenance as an Offshore Service (1) · Regression Testing Minimization, Selection and Prioritization: A Survey (1) · Software Unit Test Coverage and Adequacy (1) · The Paradox of Software Architecture and Design (1)

None (88) · 10th ed (1) · 10th ed. (2) · 11th ed. (1) · 1st ed (1) · 1st ed. (6) · 1th ed. (1) · 2nd ed (1) · 2nd ed. (22) · 2th ed. (2) · 3rd ed. (3) · 4th ed. (1) · 5th ed. (1) · 6th ed. (1) · 70-WSE-03 (1) · 7th ed. (1) · 8th ed. (1) · 9th ed (1) · 9th ed. (10) · version 3.2.2 (2) · vol. 22, no. 2 (1) · vol. 37, no. 5 (1) · vol. 83, no. 1 (1)

None (7) · ACM Press (1) · Addison Wesley (7) · Addison Wesley Professional (2) · Addison-Wesley (31) · Addison-Wesley Professional (9) · ASQ Quality Press (1) · Brooks/Cole (2) · Dorset House (1) · IEEE (14) · IEEE Software (1) · International Council on Systems Engineering (3) · ISO (2) · ISO/IEC (3) · ISO/IEC/IEEE (8) · John Hopkins University Press (1) · Jones and Bartlett Publishers (2) · McGraw-Hill (3) · McGraw-Hill and IEEE Computer Society Press (1) · Merriam-Webster (1) · Microsoft Press (6) · Morgan Kaufmann (5) · Pearson Education (3) · Pearson Education Limited (1) · Prentice Hall (4) · Prentice-Hall (1) · Project Management Institute (3) · Radio Technical Commission for Aeronautics (1) · Silicon Press (1) · Springer (2) · Taylor & Francis (2) · Technological University, Eindhoven (1) · Thomson West (1) · Wiley (4) · Wiley-IEEE Computer Society Press (12) · Wiley-Spektrum (2) · World Scientific Publishing (1)

None (146) · vol. 11, no. 2 (1) · vol. 12, no. 6 (1) · vol. 15, no. 2 (1) · vol. 29, no. 4 (1)

1970 (1) · 1979 (1) · 1981 (1) · 1988 (1) · 1989 (1) · 1990 (1) · 1993 (4) · 1994 (3) · 1995 (2) · 1996 (1) · 1997 (1) · 1998 (1) · 1999 (5) · 2000 (2) · 2001 (2) · 2002 (9) · 2003 (15) · 2004 (11) · 2005 (1) · 2006 (9) · 2007 (6) · 2008 (14) · 2009 (7) · 2010 (14) · 2011 (18) · 2012 (8) · 2013 (5) · Dec. 1997 (1) · Jan. 2010 (1) · Mar. 1994 (1) · Mar. 2012 (1) · Mar.-Apr. 1998 (1) · Sep-Oct. 2011 (1)

None (141) · pp. 1–5 (1) · pp. 21-32 (1) · pp. 366-427 (1) · pp. 42-55 (1) · pp. 46-56 (1) · pp. 500–509 (1) · pp. 60-66 (1) · pp. 649-678 (1) · pp. 67-120 (1)

None (148) · http://sites.computer.org/ccse/SE2004Volume.pdf (1) · http://www.cs.utexas.edu/users/EWD/ewd02xx/EWD249.PDF (1)

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