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references > part: pp. 649-678 & link : http://resources.sei.cmu.edu/library/asset-view.cfm?assetID=8065. or None

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number:

12 (1)

author:

Y. Jia and M. Harman (1)

article:

An Analysis and Survey of the Development of Mutation Testing (1)

publication:

IEEE Trans. Software Engineering (1)

edition:

vol. 37, no. 5 (1)

publisher:

None (1)

issue:

None (1)

date:

Sep-Oct. 2011 (1)

part: (Click arrow to add another value)

· pp. 21-32 · pp. 46-56 · pp. 1–5 · pp. 500–509 · pp. 366-427 · pp. 67-120 · pp. 60-66 · pp. 649-678 · pp. 42-55 · pp. 8, 10–23 · Other · None

link: (Click arrow to add another value)

· http://www.cs.utexas.edu/users/EWD/ewd02xx/EWD249.PDF · http://resources.sei.cmu.edu/library/asset-view.cfm?assetID=9661 · http://resources.sei.cmu.edu/library/asset-view.cfm?assetID=8065. · http://sites.computer.org/ccse/SE2004Volume.pdf · www.engineerscanada.ca/files/w Accreditation Criteria Procedures 2011.pdf · www.abet.org/uploadedFiles/Accreditation/Accreditation Process/Accreditation Documents/Current/eaccriteria-2012-2013.pdf · www.acm.org/serving/se/code.htm · Other · None

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