Drilldown: references
- Choose a table:
- acronyms (148)
- references (162)
Click on the filter values below to narrow your results.
A. April and A. Abran (1) ·
A. Silberschatz, P.B. Galvin, and G. Gagne (1) ·
C. Ebert and R. Dumke (1) ·
C. Potts, K. Takahashi, and A.I. Antón (1) ·
D.C. Montgomery and G.C. Runger (1) ·
E. Horowitz et al. (1) ·
E.W. Cheney and D.R. Kincaid (2) ·
E.W. Dijkstra (1) ·
H. Zhu, P.A.V. Hall, and J.H.R. May (1) ·
H.M. Sneed (1) ·
IEEE (1) ·
IEEE Std. (3) ·
J.G. Brookshear (3) ·
J.H. Allen et al. (2) ·
M. Utting and B. Legeard (1) ·
R.C. Seacord (1) ·
S. naik and P. Tripathy (2)
None (19) ·
IEEE Std. 12207-2008 (a.k.a. ISO/IEC 12207:2008) Standard for Systems and Software Engineering—Software Life Cycle Processes (1) ·
Inquiry-Based Requirements Analysis (1) ·
Notes on Structured Programming (1) ·
Offering Software Maintenance as an Offshore Service (1) ·
Software Unit Test Coverage and Adequacy (1)
None (1) ·
1028-2008, Software Reviews and Audits (1) ·
12207-2008 (a.k.a. ISO/IEC 12207:2008) 'Standard for Systems and Software Engineering—Software Life Cycle Processes (1) ·
12207-2008 (a.k.a. ISO/IEC 12207:2008) Standard for Systems and Software Engineering—Software Life Cycle Processes (1) ·
ACM Computing Surveys (1) ·
Applied Statistics and Probability for Engineers (1) ·
Computer Algorithms (1) ·
Computer Science: An Overview (3) ·
IEEE Software (1) ·
Numerical Mathematics and Computing (2) ·
Operating System Concepts (1) ·
Practical Model-Based Testing: A Tools Approach (1) ·
Proc. IEEE Int'l Conf. Software Maintenance (ICSM 08) (1) ·
Software Maintenance Management: Evaluation and Continuous Improvement (1) ·
Software Measurement (1) ·
Software Security Engineering: A Guide for Project Managers (2) ·
Software Testing and Quality Assurance: Theory and Practice (2) ·
T.H.-Report (1) ·
The CERT C Secure Coding Standard (1)
None (1) ·
Addison-Wesley (5) ·
Addison-Wesley Professional (1) ·
Brooks/Cole (2) ·
IEEE (5) ·
International Council on Systems Engineering (1) ·
Morgan Kaufmann (1) ·
Silicon Press (1) ·
Springer (1) ·
Technological University, Eindhoven (1) ·
Wiley (2) ·
Wiley-IEEE Computer Society Press (1) ·
Wiley-Spektrum (2)
Showing below up to 24 results in range #1 to #24.
View (previous 250 | next 250) (20 | 50 | 100 | 250 | 500)