Drilldown: references
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- acronyms (148)
- references (162)
references > author 
:
D. Budgen or
F. Bott et al or
K.E. Wiegers or
P.B. Kruchten or
S.P. Berczuk and B. Appleton or
T. Gilb and D. Graham
& publication :
Design Patterns: Elements of Reusable Object-Oriented Software or
ISO/IEC/IEEE 24765:2010 Systems and Software Engineering—Vocabulary, ISO/IEC/IEEE or
Software Security Engineering: A Guide for Project Managers or
Software Testing Verification and Reliability
& date :
1995 or
1999
& part :
pp. 366-427 or
pp. 42-55
:
D. Budgen or
F. Bott et al or
K.E. Wiegers or
P.B. Kruchten or
S.P. Berczuk and B. Appleton or
T. Gilb and D. Graham
& publication :
Design Patterns: Elements of Reusable Object-Oriented Software or
ISO/IEC/IEEE 24765:2010 Systems and Software Engineering—Vocabulary, ISO/IEC/IEEE or
Software Security Engineering: A Guide for Project Managers or
Software Testing Verification and Reliability
& date :
1995 or
1999
& part :
pp. 366-427 or
pp. 42-55 Click on the filter values below to narrow your results.
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