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references > number: 11-30 & author : D.J. Reifer or E. Gamma et al or G. Booch, J. Rumbaugh, and I. Jacobson or H.M. Sneed or IEEE or J.G. Brookshear or R.C. Seacord or T.Y. Chen et al or Other & publisher : ISO/IEC/IEEE or Pearson Education Limited or None

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