Drilldown: references
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6 
& author :
B. Boehm and R. Turner or
ISO/IEC/IEEE or
M. Bishop or
N.R. Tague
& part :
pp. 1–5 or
None
& link :
http://resources.sei.cmu.edu/library/asset-view.cfm?assetID=8065. or
None
& author :
B. Boehm and R. Turner or
ISO/IEC/IEEE or
M. Bishop or
N.R. Tague
& part :
pp. 1–5 or
None
& link :
http://resources.sei.cmu.edu/library/asset-view.cfm?assetID=8065. or
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