Drilldown: references
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- acronyms (148)
- references (162)
references > number:
11-30
& author :
A. van Lamsweerde or
E. Gamma et al or
G. Booch, J. Rumbaugh, and I. Jacobson or
IEEE or
J.G. Brookshear or
M. Bishop or
S. McConnell or
T.Y. Chen et al
& publication :
Journal of Systems and Software or
Software Testing and Quality Assurance: Theory and Practice
& publisher :
ISO/IEC/IEEE or
Pearson Education Limited or
Thomson West
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