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references > number: 11-30 & author : A. van Lamsweerde or E. Gamma et al or G. Booch, J. Rumbaugh, and I. Jacobson or IEEE or J.G. Brookshear or M. Bishop or S. McConnell or T.Y. Chen et al & publication : Journal of Systems and Software or Software Testing and Quality Assurance: Theory and Practice & publisher : ISO/IEC/IEEE or Pearson Education Limited or Thomson West

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