Drilldown: references

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acronyms (148)
references (162)

references > author

: A. Abran

or C. Potts, K. Takahashi, and A.I. Antón

or G. Voland

or S.P. Berczuk and B. Appleton

or Y. Jia and M. Harman

or Other

& issue

: vol. 29, no. 4

or None

& link: None

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1 - 3 (27) · 3 - 5 (27) · 5 - 7 (22) · 7 - 11 (31) · 11 - 30 (34)

None (131) · Adaptive Random Testing: The ART of Test Case Diversity (1) · An Analysis and Survey of the Development of Mutation Testing (1) · An Analysis of the Requirements Traceability Problem (1) · IEEE Std. 12207-2008 (a.k.a. ISO/IEC 12207:2008) Standard for Systems and Software Engineering—Software Life Cycle Processes (1) · IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes (1) · Offering Software Maintenance as an Offshore Service (1) · Regression Testing Minimization, Selection and Prioritization: A Survey (1) · Software Unit Test Coverage and Adequacy (1) · The Essentials of Computer Organization and Architecture (1) · The Paradox of Software Architecture and Design (1)

None (79) · 10th ed (1) · 10th ed. (2) · 11th ed (1) · 11th ed. (1) · 1st ed (1) · 1st ed. (6) · 1th ed. (1) · 2nd ed (1) · 2nd ed. (23) · 2th ed. (2) · 3rd ed. (3) · 4th ed. (1) · 5th ed. (1) · 6th ed. (1) · 7th ed. (1) · 8th ed. (1) · 9th ed (1) · 9th ed. (9) · version 3.2.2 (2) · vol. 22, no. 2 (1) · vol. 37, no. 5 (1) · vol. 83, no. 1 (1)

None (6) · ACM Press (1) · Addison Wesley (7) · Addison Wesley Professional (2) · Addison-Wesley (30) · Addison-Wesley Professional (9) · ASQ Quality Press (1) · Brooks/Cole (2) · Dorset House (1) · IEEE (14) · International Council on Systems Engineering (2) · ISO (2) · ISO/IEC (2) · ISO/IEC/IEEE (4) · John Hopkins University Press (1) · Jones and Bartlett Publishers (3) · McGraw-Hill (3) · McGraw-Hill and IEEE Computer Society Press (1) · Merriam-Webster (1) · Microsoft Press (6) · Morgan Kaufmann (5) · Pearson Education (3) · Pearson Education Limited (1) · Prentice Hall (4) · Prentice-Hall (1) · Project Management Institute (3) · Radio Technical Commission for Aeronautics (1) · Silicon Press (1) · Springer (2) · Taylor & Francis (2) · Thomson West (1) · Wiley (4) · Wiley-IEEE Computer Society Press (12) · Wiley-Spektrum (2) · World Scientific Publishing (1)

1979 (1) · 1981 (1) · 1988 (1) · 1989 (1) · 1990 (1) · 1993 (4) · 1994 (3) · 1995 (1) · 1996 (1) · 1997 (1) · 1998 (1) · 1999 (5) · 2000 (2) · 2001 (2) · 2002 (9) · 2003 (16) · 2004 (9) · 2005 (1) · 2006 (10) · 2007 (6) · 2008 (15) · 2009 (7) · 2010 (12) · 2011 (17) · 2012 (5) · 2013 (5) · Dec. 1997 (1) · Jan. 2010 (1) · Mar. 2012 (1) · Sep-Oct. 2011 (1)

None (135) · pp. 1–5 (1) · pp. 366-427 (1) · pp. 500–509 (1) · pp. 60-66 (1) · pp. 649-678 (1) · pp. 67-120 (1)

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