Drilldown: references
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- acronyms (148)
- references (162)
references > author :
A.M.J Hass or
S. Yoo and M. Harman or
Y. Jia and M. Harman or
H. Zhu, P.A.V. Hall, and J.H.R. May or
IEEE or
J.H. Allen et al. or
M. Bishop or
M. Utting and B. Legeard or
P. Clements et al. or
P. Grubb and A.A. Takang or
P.B. Kruchten or
S. McConnell
& edition :
10th ed or
11th ed. or
9th ed or
9th ed. or
vol. 22, no. 2 or
vol. 37, no. 5 or
None
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None (9) ·
An Analysis and Survey of the Development of Mutation Testing (1) ·
IEEE Std. 12207-2008 (a.k.a. ISO/IEC 12207:2008) Standard for Systems and Software Engineering—Software Life Cycle Processes (1) ·
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes (1) ·
Regression Testing Minimization, Selection and Prioritization: A Survey (1) ·
Software Unit Test Coverage and Adequacy (1)
None (2) ·
ACM Computing Surveys (1) ·
Computer Security: Art and Science (1) ·
IEEE Std. 1069-2009 Standard for Information Technology—Systems Design—Software Design Descriptions (1) ·
IEEE Trans. Software Engineering (1) ·
ISO/IEC/IEEE 24765:2010 Systems and Software Engineering—Vocabulary, ISO/IEC/IEEE (2) ·
P730™/D8 Draft Standard for Software Quality Assurance Processes (1) ·
Practical Model-Based Testing: A Tools Approach (1) ·
Software Security Engineering: A Guide for Project Managers (2) ·
Software Testing Verification and Reliability (1) ·
The 4+1 View Model of Architecture (1)
1995 (1) ·
2002 (1) ·
2007 (1) ·
2008 (3) ·
2009 (1) ·
2010 (3) ·
2012 (1) ·
Dec. 1997 (1) ·
Mar. 2012 (1) ·
Sep-Oct. 2011 (1)
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