Drilldown: references
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references > author 
:
A. Abran or
Merriam-Webster or
S. Yoo and M. Harman or
T.Y. Chen et al or
B. Boehm and R. Turner or
E. Gamma et al. or
I. Alexander and L. Beus-Duekic or
IEEE Std. or
ISO or
ISO/IEC or
ISO/IEC/IEEE or
J. Bosch or
J.G. Brookshear
& article:
None
& edition :
11th ed. or
1th ed. or
2nd ed. or
2th ed or
None
& publisher :
Computer or
McGraw-Hill or
Merriam-Webster or
Radio Technical Commission for Aeronautics
& date :
1989 or
2003 or
Jan. 2010
:
A. Abran or
Merriam-Webster or
S. Yoo and M. Harman or
T.Y. Chen et al or
B. Boehm and R. Turner or
E. Gamma et al. or
I. Alexander and L. Beus-Duekic or
IEEE Std. or
ISO or
ISO/IEC or
ISO/IEC/IEEE or
J. Bosch or
J.G. Brookshear
& article:
None
& edition :
11th ed. or
1th ed. or
2nd ed. or
2th ed or
None
& publisher :
Computer or
McGraw-Hill or
Merriam-Webster or
Radio Technical Commission for Aeronautics
& date :
1989 or
2003 or
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