Drilldown: references
- Choose a table:
- acronyms (148)
- references (162)
references > author 
:
A. Abran or
Merriam-Webster or
S. Yoo and M. Harman or
T.Y. Chen et al or
B. Boehm and R. Turner or
E. Gamma et al. or
F. Bott et al. or
IEEE Std. or
ISO or
ISO/IEC or
ISO/IEC/IEEE or
J. Bosch or
J.G. Brookshear
& article:
None
& edition :
11th ed. or
1th ed. or
2nd ed. or
2th ed or
None
& publisher :
Computer or
McGraw-Hill or
Merriam-Webster or
Radio Technical Commission for Aeronautics
& date :
1989 or
2003 or
Jan. 2010
:
A. Abran or
Merriam-Webster or
S. Yoo and M. Harman or
T.Y. Chen et al or
B. Boehm and R. Turner or
E. Gamma et al. or
F. Bott et al. or
IEEE Std. or
ISO or
ISO/IEC or
ISO/IEC/IEEE or
J. Bosch or
J.G. Brookshear
& article:
None
& edition :
11th ed. or
1th ed. or
2nd ed. or
2th ed or
None
& publisher :
Computer or
McGraw-Hill or
Merriam-Webster or
Radio Technical Commission for Aeronautics
& date :
1989 or
2003 or
Jan. 2010 Click on the filter values below to narrow your results.
number:
author: (Click arrow to add another value)
article: (Click arrow to add another value)
publication:
edition: (Click arrow to add another value)
publisher: (Click arrow to add another value)
issue:
date: (Click arrow to add another value)
part:
link:
Showing below up to 1 result in range #1 to #1.
View (previous 250 | next 250) (20 | 50 | 100 | 250 | 500)
