Drilldown: references

references > author

: B. Boehm and R. Turner

or R.C. Seacord

or S. Yoo and M. Harman

or D.J. Reifer

or E. Gamma et al.

or ISO

or ISO/IEC

or ISO/IEC/IEEE

or J. Bosch

or J.G. Brookshear

or Merriam-Webster

or Merriam-Webster’s Collegiate Dictionary

& article: IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes

& edition

: 11th ed.

or 1th ed.

or 2nd ed.

or 2th ed

or None

& publisher

: Computer

or McGraw-Hill

or Merriam-Webster

or Wiley-Spektrum

& date

: 1989

or 2003

or Jan. 2010

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