Drilldown: references

references > author

: B. Boehm and R. Turner

or R.C. Seacord

or S. McConnell

or S. Yoo and M. Harman

or D.J. Reifer

or E. Gamma et al.

or G. Voland

or ISO

or ISO/IEC

or ISO/IEC/IEEE

or J. Bosch

or Merriam-Webster

or Merriam-Webster’s Collegiate Dictionary

& article: IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes

& edition

: 11th ed.

or 1th ed.

or 2nd ed.

or 2th ed

or None

& publisher

: Computer

or McGraw-Hill

or Merriam-Webster

or Wiley-Spektrum

& date

: 1989

or 2003

or Jan. 2010

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