Drilldown: references
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references > number:
11-30 
& author :
E. Gamma et al or
G. Booch, J. Rumbaugh, and I. Jacobson or
I. Jacobson, G. Booch, and J. Rumbaugh or
IEEE or
ISO or
J. Bosch or
J.G. Brookshear or
L. Null and J. Lobur or
S. McConnell or
S.H. Kan or
T.Y. Chen et al or
None
& article:
Adaptive Random Testing: The ART of Test Case Diversity
& publisher :
Addison-Wesley or
IEEE Software or
ISO/IEC/IEEE or
None or
None
& author :
E. Gamma et al or
G. Booch, J. Rumbaugh, and I. Jacobson or
I. Jacobson, G. Booch, and J. Rumbaugh or
IEEE or
ISO or
J. Bosch or
J.G. Brookshear or
L. Null and J. Lobur or
S. McConnell or
S.H. Kan or
T.Y. Chen et al or
None
& article:
Adaptive Random Testing: The ART of Test Case Diversity
& publisher :
Addison-Wesley or
IEEE Software or
ISO/IEC/IEEE or
None or
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