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11 
& author :
ABET Engineering Accreditation Commission or
P. Clements et al. or
S. naik and P. Tripathy or
S.H. Kan or
T. DeMarco or
T.Y. Chen et al or
Other
& article:
Adaptive Random Testing: The ART of Test Case Diversity
& publisher :
Canadian Council of Professional Engineers or
IEEE or
McGraw-Hill and IEEE Computer Society Press or
Wiley-Spektrum or
None
& date:
Jan. 2010
& author :
ABET Engineering Accreditation Commission or
P. Clements et al. or
S. naik and P. Tripathy or
S.H. Kan or
T. DeMarco or
T.Y. Chen et al or
Other
& article:
Adaptive Random Testing: The ART of Test Case Diversity
& publisher :
Canadian Council of Professional Engineers or
IEEE or
McGraw-Hill and IEEE Computer Society Press or
Wiley-Spektrum or
None
& date:
Jan. 2010 Click on the filter values below to narrow your results.
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