Drilldown: references
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- acronyms (148)
- references (162)
references > number:
11 
& author :
A. April and A. Abran or
L. Bass, P. Clements, and R. Kazman or
P. Clements et al. or
S. naik and P. Tripathy or
T. DeMarco or
T.Y. Chen et al
& article:
Adaptive Random Testing: The ART of Test Case Diversity
& edition :
4th ed. or
vol. 83, no. 1
& publisher :
Brooks/Cole or
Canadian Council of Professional Engineers or
IEEE or
ISO/IEC or
John Hopkins University Press or
McGraw-Hill and IEEE Computer Society Press or
Merriam-Webster
& date :
2013 or
Jan. 2010
& author :
A. April and A. Abran or
L. Bass, P. Clements, and R. Kazman or
P. Clements et al. or
S. naik and P. Tripathy or
T. DeMarco or
T.Y. Chen et al
& article:
Adaptive Random Testing: The ART of Test Case Diversity
& edition :
4th ed. or
vol. 83, no. 1
& publisher :
Brooks/Cole or
Canadian Council of Professional Engineers or
IEEE or
ISO/IEC or
John Hopkins University Press or
McGraw-Hill and IEEE Computer Society Press or
Merriam-Webster
& date :
2013 or
Jan. 2010 Click on the filter values below to narrow your results.
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