Drilldown: references
- Choose a table:
- acronyms (148)
- references (162)
references > author 
:
A.M.J Hass or
I. Jacobson, G. Booch, and J. Rumbaugh or
Joint Task Force on Computing Curricula, IEEE Computer Society and Association for Computing Machinery or
Kinney and Lange, P.A. or
N.A. Maiden and C. Ncube or
P. Grubb and A.A. Takang or
S. Tockey or
S.J. Mellor and M.J. Balcer or
T.Y. Chen et al
& article:
Adaptive Random Testing: The ART of Test Case Diversity
& edition :
2th ed or
3rd ed. or
70-WSE-03 or
9th ed or
vol. 83, no. 1
& publisher :
McGraw-Hill and IEEE Computer Society Press or
Springer or
None
& date :
2005 or
Jan. 2010
:
A.M.J Hass or
I. Jacobson, G. Booch, and J. Rumbaugh or
Joint Task Force on Computing Curricula, IEEE Computer Society and Association for Computing Machinery or
Kinney and Lange, P.A. or
N.A. Maiden and C. Ncube or
P. Grubb and A.A. Takang or
S. Tockey or
S.J. Mellor and M.J. Balcer or
T.Y. Chen et al
& article:
Adaptive Random Testing: The ART of Test Case Diversity
& edition :
2th ed or
3rd ed. or
70-WSE-03 or
9th ed or
vol. 83, no. 1
& publisher :
McGraw-Hill and IEEE Computer Society Press or
Springer or
None
& date :
2005 or
Jan. 2010 Click on the filter values below to narrow your results.
number:
author: (Click arrow to add another value)
article: (Click arrow to add another value)
publication:
edition: (Click arrow to add another value)
publisher: (Click arrow to add another value)
issue:
date: (Click arrow to add another value)
part:
link:
Showing below up to 1 result in range #1 to #1.
View (previous 250 | next 250) (20 | 50 | 100 | 250 | 500)
