Drilldown: references
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references > author 
:
C. Ebert and R. Dumke or
S. Friedenthal, A. Morre, and R. Steiner or
S.H. Kan or
D.J. Reifer or
E. Horowitz et al. or
G. Voland or
ISO/IEC/IEEE or
J. Nielsen or
J.G. Brookshear or
L. Null and J. Lobur or
M.R. Lyu, ed. or
P.B. Crosby
& article :
Software Unit Test Coverage and Adequacy or
None
& issue:
None
& date :
1970 or
1979 or
1998 or
2003
:
C. Ebert and R. Dumke or
S. Friedenthal, A. Morre, and R. Steiner or
S.H. Kan or
D.J. Reifer or
E. Horowitz et al. or
G. Voland or
ISO/IEC/IEEE or
J. Nielsen or
J.G. Brookshear or
L. Null and J. Lobur or
M.R. Lyu, ed. or
P.B. Crosby
& article :
Software Unit Test Coverage and Adequacy or
None
& issue:
None
& date :
1970 or
1979 or
1998 or
2003 Click on the filter values below to narrow your results.
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