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references > number: 11-30 & author : A. Abran or E. Horowitz et al. or J.H. Allen et al. or M. Utting and B. Legeard or N. Leveson or N.A. Maiden and C. Ncube or S. naik and P. Tripathy or S.H. Kan or T.Y. Chen et al & article : Software Unit Test Coverage and Adequacy or None

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