Drilldown: references
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- acronyms (148)
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references > author 
:
A. Abran or
F. Bott et al. or
H.M. Sneed or
P. Clements et al or
P. Grubb and A.A. Takang or
P.B. Crosby or
T.Y. Chen et al or
Y. Jia and M. Harman
& article :
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
None
& date :
1979 or
1993 or
2003 or
None
:
A. Abran or
F. Bott et al. or
H.M. Sneed or
P. Clements et al or
P. Grubb and A.A. Takang or
P.B. Crosby or
T.Y. Chen et al or
Y. Jia and M. Harman
& article :
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
None
& date :
1979 or
1993 or
2003 or
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