Drilldown: references
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- acronyms (148)
- references (162)
references > number:
11-30
& article :
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
Software Unit Test Coverage and Adequacy
& publisher :
Canadian Council of Professional Engineers or
John Hopkins University Press or
Radio Technical Commission for Aeronautics or
Taylor & Francis
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