Drilldown: references
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references > author 
:
A.M.J Hass or
B. Boehm and R. Turner or
H. Zhu, P.A.V. Hall, and J.H.R. May or
M. Bishop or
O. Gotel and C.W. Finkelstein or
S. naik and P. Tripathy or
T. DeMarco
& article :
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
Software Unit Test Coverage and Adequacy or
The Paradox of Software Architecture and Design
& date :
1988 or
1999
:
A.M.J Hass or
B. Boehm and R. Turner or
H. Zhu, P.A.V. Hall, and J.H.R. May or
M. Bishop or
O. Gotel and C.W. Finkelstein or
S. naik and P. Tripathy or
T. DeMarco
& article :
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
Software Unit Test Coverage and Adequacy or
The Paradox of Software Architecture and Design
& date :
1988 or
1999 Click on the filter values below to narrow your results.
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