Drilldown: references
- Choose a table:
- acronyms (148)
- references (162)
references > number:
11 
& author :
A. Silberschatz, P.B. Galvin, and G. Gagne or
E.W. Cheney and D.R. Kincaid or
IEEE or
P. Clements et al. or
S. McConnell or
S. naik and P. Tripathy or
T. DeMarco or
T.Y. Chen et al
& article :
An Analysis and Survey of the Development of Mutation Testing or
None
& edition :
4th ed. or
vol. 83, no. 1
& publisher :
Addison Wesley or
Canadian Council of Professional Engineers or
ISO or
International Council on Systems Engineering or
McGraw-Hill and IEEE Computer Society Press or
None
& date:
Jan. 2010
& author :
A. Silberschatz, P.B. Galvin, and G. Gagne or
E.W. Cheney and D.R. Kincaid or
IEEE or
P. Clements et al. or
S. McConnell or
S. naik and P. Tripathy or
T. DeMarco or
T.Y. Chen et al
& article :
An Analysis and Survey of the Development of Mutation Testing or
None
& edition :
4th ed. or
vol. 83, no. 1
& publisher :
Addison Wesley or
Canadian Council of Professional Engineers or
ISO or
International Council on Systems Engineering or
McGraw-Hill and IEEE Computer Society Press or
None
& date:
Jan. 2010 Click on the filter values below to narrow your results.
number:
(There are no values for this filter)
author: (Click arrow to add another value)
article: (Click arrow to add another value)
publication:
(There are no values for this filter)
edition: (Click arrow to add another value)
publisher: (Click arrow to add another value)
issue:
(There are no values for this filter)
date: (Click arrow to add another value)
part:
(There are no values for this filter)
link:
(There are no values for this filter)
There are no results for this report.
