Drilldown: references
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- acronyms (148)
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references > article :
An Analysis and Survey of the Development of Mutation Testing or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes
& publication :
Computer Security: Art and Science or
Software Design or
Usability Engineering
& edition :
11th ed. or
2th ed or
Other
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