Drilldown: references
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- acronyms (148)
- references (162)
references > article
:
An Analysis and Survey of the Development of Mutation Testing
or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes
or
None
& publisher
:
Canadian Council of Professional Engineers
or
Jones and Bartlett Publishers
or
Wiley
& date
:
1990
or
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