Drilldown: references
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references > author 
:
E. Gamma et al. or
G. Kiczales et al. or
G. Voland or
M. Page-Jones or
N.R. Tague
& article :
An Analysis and Survey of the Development of Mutation Testing or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
None
& date :
1988 or
1990 or
1993 or
1999 or
2001 or
Mar.-Apr. 1998
& part :
pp. 649-678 or
None
:
E. Gamma et al. or
G. Kiczales et al. or
G. Voland or
M. Page-Jones or
N.R. Tague
& article :
An Analysis and Survey of the Development of Mutation Testing or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
None
& date :
1988 or
1990 or
1993 or
1999 or
2001 or
Mar.-Apr. 1998
& part :
pp. 649-678 or
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