Drilldown: references
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12 
& author :
G.M. Weinberg or
I. Alexander and L. Beus-Duekic or
L. Bass, P. Clements, and R. Kazman or
N. Leveson or
P.B. Kruchten or
S. Yoo and M. Harman
& article :
An Analysis and Survey of the Development of Mutation Testing or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
Software Engineering Code of Ethics and Professional Practice (Version 5.2)
& author :
G.M. Weinberg or
I. Alexander and L. Beus-Duekic or
L. Bass, P. Clements, and R. Kazman or
N. Leveson or
P.B. Kruchten or
S. Yoo and M. Harman
& article :
An Analysis and Survey of the Development of Mutation Testing or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
Software Engineering Code of Ethics and Professional Practice (Version 5.2) Click on the filter values below to narrow your results.
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