Drilldown: references
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12 
& author :
D.J. Reifer or
G.M. Weinberg or
I. Alexander and L. Beus-Duekic or
IEEE CS/ACM Joint Task Force onSoftware Engineering Ethics and Professional Practices or
L. Bass, P. Clements, and R. Kazman or
N. Leveson or
P.B. Kruchten or
S. Yoo and M. Harman or
Y. Jia and M. Harman
& article :
An Analysis and Survey of the Development of Mutation Testing or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
Regression Testing Minimization, Selection and Prioritization: A Survey or
Software Engineering Code of Ethics and Professional Practice (Version 5.2)
& author :
D.J. Reifer or
G.M. Weinberg or
I. Alexander and L. Beus-Duekic or
IEEE CS/ACM Joint Task Force onSoftware Engineering Ethics and Professional Practices or
L. Bass, P. Clements, and R. Kazman or
N. Leveson or
P.B. Kruchten or
S. Yoo and M. Harman or
Y. Jia and M. Harman
& article :
An Analysis and Survey of the Development of Mutation Testing or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
Regression Testing Minimization, Selection and Prioritization: A Survey or
Software Engineering Code of Ethics and Professional Practice (Version 5.2) Click on the filter values below to narrow your results.
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