Drilldown: references
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- acronyms (148)
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IEEE Std.
or
L. Null and J. Lobur
or
S.J. Mellor and M.J. Balcer
& article
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An Analysis and Survey of the Development of Mutation Testing
or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes
or
Performance Results of CMMI-Based Process Improvement
or
The Essentials of Computer Organization and Architecture
& publication:
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