Drilldown: references
- Choose a table:
- acronyms (148)
- references (162)
references > number:
11 
& author :
E.W. Cheney and D.R. Kincaid or
IEEE or
P. Clements et al. or
S. naik and P. Tripathy or
S.P. Berczuk and B. Appleton or
T. DeMarco or
T.Y. Chen et al
& article :
Adaptive Random Testing: The ART of Test Case Diversity or
Software Unit Test Coverage and Adequacy or
None
& edition :
4th ed. or
vol. 83, no. 1
& publisher :
Addison Wesley or
Canadian Council of Professional Engineers or
McGraw-Hill and IEEE Computer Society Press or
None
& date:
Jan. 2010
& author :
E.W. Cheney and D.R. Kincaid or
IEEE or
P. Clements et al. or
S. naik and P. Tripathy or
S.P. Berczuk and B. Appleton or
T. DeMarco or
T.Y. Chen et al
& article :
Adaptive Random Testing: The ART of Test Case Diversity or
Software Unit Test Coverage and Adequacy or
None
& edition :
4th ed. or
vol. 83, no. 1
& publisher :
Addison Wesley or
Canadian Council of Professional Engineers or
McGraw-Hill and IEEE Computer Society Press or
None
& date:
Jan. 2010 Click on the filter values below to narrow your results.
number:
author: (Click arrow to add another value)
article: (Click arrow to add another value)
publication:
edition: (Click arrow to add another value)
publisher: (Click arrow to add another value)
issue:
date: (Click arrow to add another value)
part:
link:
Showing below up to 1 result in range #1 to #1.
View (previous 250 | next 250) (20 | 50 | 100 | 250 | 500)
