Drilldown: references
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:
A. van Lamsweerde or
I. Alexander and L. Beus-Duekic or
P. Grubb and A.A. Takang or
T. DeMarco or
T.Y. Chen et al
& article :
Adaptive Random Testing: The ART of Test Case Diversity or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
The Essentials of Computer Organization and Architecture or
“A Specifier’s Introduction to Formal Methods”
:
A. van Lamsweerde or
I. Alexander and L. Beus-Duekic or
P. Grubb and A.A. Takang or
T. DeMarco or
T.Y. Chen et al
& article :
Adaptive Random Testing: The ART of Test Case Diversity or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
The Essentials of Computer Organization and Architecture or
“A Specifier’s Introduction to Formal Methods” Click on the filter values below to narrow your results.
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