Drilldown: references
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references > number:
11 
& author :
IEEE or
M. Bishop or
P. Clements et al. or
S. Friedenthal, A. Morre, and R. Steiner or
S. naik and P. Tripathy or
T. DeMarco or
T.Y. Chen et al
& article :
Adaptive Random Testing: The ART of Test Case Diversity or
Criteria for Accrediting Engineering Programs, 2012-2013 or
None
& edition :
10th ed. or
1th ed. or
4th ed. or
version 3.2.2 or
vol. 83, no. 1
& publisher :
Addison Wesley or
Canadian Council of Professional Engineers or
McGraw-Hill and IEEE Computer Society Press or
Pearson Education or
None
& date:
Jan. 2010
& author :
IEEE or
M. Bishop or
P. Clements et al. or
S. Friedenthal, A. Morre, and R. Steiner or
S. naik and P. Tripathy or
T. DeMarco or
T.Y. Chen et al
& article :
Adaptive Random Testing: The ART of Test Case Diversity or
Criteria for Accrediting Engineering Programs, 2012-2013 or
None
& edition :
10th ed. or
1th ed. or
4th ed. or
version 3.2.2 or
vol. 83, no. 1
& publisher :
Addison Wesley or
Canadian Council of Professional Engineers or
McGraw-Hill and IEEE Computer Society Press or
Pearson Education or
None
& date:
Jan. 2010 Click on the filter values below to narrow your results.
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