Drilldown: references
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- acronyms (148)
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references > author 
:
B. Boehm and R. Turner or
Y. Jia and M. Harman or
D. Galin or
G. Kiczales et al. or
I. Jacobson, G. Booch, and J. Rumbaugh or
J. Bosch or
M. Page-Jones or
Merriam-Webster or
Merriam-Webster’s Collegiate Dictionary or
RTCA or
T. DeMarco
& article :
Accreditation Criteria and Procedures or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
Regression Testing Minimization, Selection and Prioritization: A Survey or
The Paradox of Software Architecture and Design
& edition :
6th ed. or
8th ed. or
version 3.2.2 or
None
& date :
1988 or
1997 or
1999 or
2006 or
2010
& part :
pp. 21-32 or
None
:
B. Boehm and R. Turner or
Y. Jia and M. Harman or
D. Galin or
G. Kiczales et al. or
I. Jacobson, G. Booch, and J. Rumbaugh or
J. Bosch or
M. Page-Jones or
Merriam-Webster or
Merriam-Webster’s Collegiate Dictionary or
RTCA or
T. DeMarco
& article :
Accreditation Criteria and Procedures or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes or
Regression Testing Minimization, Selection and Prioritization: A Survey or
The Paradox of Software Architecture and Design
& edition :
6th ed. or
8th ed. or
version 3.2.2 or
None
& date :
1988 or
1997 or
1999 or
2006 or
2010
& part :
pp. 21-32 or
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