Drilldown: references
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- acronyms (148)
- references (162)
references > author 
:
A. Abran or
T.Y. Chen et al or
Y. Jia and M. Harman or
Other or
B. Boehm and R. Turner or
D. Galin or
G. Kiczales et al. or
IEEE Std. or
ISO/IEC/IEEE. or
M. Page-Jones or
Merriam-Webster or
Merriam-Webster’s Collegiate Dictionary or
T. DeMarco
& article :
Accreditation Criteria and Procedures or
IEEE Std. 12207-2008 (a.k.a. ISO/IEC 12207:2008) Standard for Systems and Software Engineering—Software Life Cycle Processes or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes
& edition :
6th ed. or
8th ed. or
version 3.2.2 or
None
& date :
1988 or
1997 or
1999 or
2006 or
2009 or
2010
& part :
pp. 21-32 or
None
:
A. Abran or
T.Y. Chen et al or
Y. Jia and M. Harman or
Other or
B. Boehm and R. Turner or
D. Galin or
G. Kiczales et al. or
IEEE Std. or
ISO/IEC/IEEE. or
M. Page-Jones or
Merriam-Webster or
Merriam-Webster’s Collegiate Dictionary or
T. DeMarco
& article :
Accreditation Criteria and Procedures or
IEEE Std. 12207-2008 (a.k.a. ISO/IEC 12207:2008) Standard for Systems and Software Engineering—Software Life Cycle Processes or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes
& edition :
6th ed. or
8th ed. or
version 3.2.2 or
None
& date :
1988 or
1997 or
1999 or
2006 or
2009 or
2010
& part :
pp. 21-32 or
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