Drilldown: references
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- acronyms (148)
- references (162)
references > article :
Accreditation Criteria and Procedures or
An Analysis and Survey of the Development of Mutation Testing or
IEEE Std. 1517-2010 Standard for Information Technology—System and Software Life Cycle Processes—Reuse Processes
& edition :
2nd ed. or
6th ed. or
version 3.2.2 or
None
& publisher :
Addison Wesley Professional or
Radio Technical Commission for Aeronautics or
Springer
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